LNCREASED RISK OF SLIPPAGE UPON DISENGAGEMENT OF THE MITOTIC CHECKPOINT.




Ultrafast Mechanism of Material Removal in the Femtosecond Laser Ablation of WS2 and Its Diode Rectification Characteristics

The study investigates the two different underlying ablation mechanisms Faux Tweed Coats of WS2 processed by femtosecond (fs) laser with different fluences.With increasing fluence, the saturable expansion of craters and the transformation of three distinct crater morphologies are found.The material response and the transfer and deposition of laser

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